QP12-Nanoprofilometer
Precision You Can Rely On — Down to the Nanometer
Our optical profilometer is engineered for ultra-precise surface topography measurements with Z-axis accuracy of 1 nanometer. Designed for researchers and engineers who require reliable, high-resolution surface characterization, the system delivers consistent results across a wide range of materials and geometries.
Key Features:
- 1 nm Z-axis resolution for vertical surface profiling
- Non-contact optical measurement — ideal for delicate or soft materials
- Fast scanning and high repeatability
- User-friendly interface and powerful analysis tools
- Suitable for lab environments and production settings
Applications:
- Semiconductor surface inspection
- MEMS and microfluidic device analysis
- Thin film and coating characterization
- Precision manufacturing and metrology research